![]() It is meant to be combined with the hands-on Workshop on "Curve fitting using CasaXPS Software". It is aimed at people who are currently generating XPS data or processing data generated on their behalf. This lecture introduces curve fitting of XPS data. This talk is geared toward those who want to hear the types of problems that can be solved with the FIB. FIB also enables one to 1) perform complex patterning, 2) make site-specific cross-sections, 3) prepare transmission electron microscopy (TEM) samples and 4) observe the 3D structure by serial sectioning. The two can be used to observe the subsurface structure and make site-specific modifications. The focused ion beam (FIB) is a complement to a scanning electron microscope (SEM). The principle of the technique will be discussed and the advantages and disadvantages along with case studies. This lecture is aimed at anyone with an interest in learning about X-ray photoelectron spectroscopy. Introduction to X-ray Photoelectron Spectroscopy (XPS) These will include a mixture of basic overviews of techniques aimed at anyone interested in these methods and more focused workshops primarily aimed at users that are currently trained in a technique but want to pursue a more advanced skill. On Tuesdays and Thursdays throughout the summer MCL staff will be offering a series of free, one-hour lectures and workshops on various characterization topics. ![]()
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